A05: Parallel Prefix Algorithms for the Registration of
Arbitrarily Long Electron Micrograph Series
SessionPoster Reception
Author
Event Type
ACM Student Research Competition
Poster
Reception
TimeTuesday, November 14th5:15pm -
7pm
LocationFour Seasons Ballroom
DescriptionRecent advances in the technology of transmission
electron microscopy have allowed for a more precise
visualization of materials and physical processes, such
as metal oxidation. Nevertheless, the quality of
information is limited by the damage caused by an
electron beam, movement of the specimen or other
environmental factors. A novel registration method has
been proposed to remove those limitations by acquiring a
series of low dose microscopy frames and performing a
computational registration on them to understand and
visualize the sample. This process can be represented as
a prefix sum with a complex and computationally
intensive binary operator and a parallelization is
necessary to enable processing long series of microscopy
images. With our parallelization scheme, the time of
registration of results from ten seconds of microscopy
acquisition has been decreased from almost thirteen
hours to less than seven minutes on 512 Intel IvyBridge
cores.
